Novel approaches to optical reflectometry
The author reviews the fundamentals of optical reflectometry, including the standard optical time-domain reflectometry (OTDR) measurement. Some novel reflectometry schemes are described, including a spread-spectrum approach to long-range OTDR, as well as new optical frequency-domain reflectometry (O...
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Published in | 7th IEEE Conference on Instrumentation and Measurement Technology pp. 329 - 333 |
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Main Author | |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1990
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Subjects | |
Online Access | Get full text |
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Summary: | The author reviews the fundamentals of optical reflectometry, including the standard optical time-domain reflectometry (OTDR) measurement. Some novel reflectometry schemes are described, including a spread-spectrum approach to long-range OTDR, as well as new optical frequency-domain reflectometry (OFDR) techniques that have proven useful for high-resolution measurements. These novel reflectometry techniques are suitable for testing both fiber links and small components. The spread-spectrum technique allows improved dynamic range without sacrificing resolution. High-speed modulators and detectors now allow the extension of OFDR techniques to high frequencies. Resulting measurements show a large dynamic range and resolution better than 4 mm.< > |
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DOI: | 10.1109/IMTC.1990.66032 |