A study on the metal-flanged open-ended coaxial line terminating in a conductor-backed dielectric layer

A spectral domain approach is used to analyze aperture fields and aperture admittance of an open-ended coaxial line terminated by a conductor-backed dielectric layer. The aperture admittance and capacitance at various frequencies and thicknesses are calculated for various dielectrics. It is shown th...

Full description

Saved in:
Bibliographic Details
Published in7th IEEE Conference on Instrumentation and Measurement Technology pp. 43 - 46
Main Authors Fan, S., Misra, D.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1990
Subjects
Admittance
Apertures
Biological materials
Capacitance
Coaxial components
Dielectrics
Electric variables measurement
Electromagnetic measurements
Frequency
Methanol
Online AccessGet full text

Cover

More Information
Summary:A spectral domain approach is used to analyze aperture fields and aperture admittance of an open-ended coaxial line terminated by a conductor-backed dielectric layer. The aperture admittance and capacitance at various frequencies and thicknesses are calculated for various dielectrics. It is shown that, for d>or=2b, the results are very close to those for the infinitely thick dielectric medium. The results are expected to be useful in developing suitable procedures for measuring the electrical properties of samples with small thicknesses.< >
DOI:10.1109/IMTC.1990.65956