Combination of modeling and simple real-time measurements to control plasma-surface interaction processes

The increasing complexity in industrial plasma processing demands new strategies for process control and monitoring. The energy transport mechanisms in the interface region between non-thermal low-pressure plasma and surface are of particular importance. Measurements of the "in situ" surfa...

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Bibliographic Details
Published in2012 Abstracts IEEE International Conference on Plasma Science p. 3P-110
Main Authors Greb, A., Niemi, K., O'Connell, D., Gans, T., Ennis, G. J., MacGearailt, N.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.07.2012
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Summary:The increasing complexity in industrial plasma processing demands new strategies for process control and monitoring. The energy transport mechanisms in the interface region between non-thermal low-pressure plasma and surface are of particular importance. Measurements of the "in situ" surface condition, which strongly affects the plasma-surface interaction processes, are extremely challenging. The most promising approach for advanced process monitoring is the active coupling of semi-kinetic simulations and diagnostics.
ISBN:9781457721274
1457721279
ISSN:0730-9244
2576-7208
DOI:10.1109/PLASMA.2012.6383895