1/f noise temperature behaviour of poly resistors

This paper presents the 1/f noise behaviour over a temperature range from -50°C to +200°C for poly resistor devices with sheet resistance 50 Ω/□ and 1.2 kΩ/□. Based on statistical measurement data a classical approach of 2th order is used to model the flicker noise characterization data as function...

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Bibliographic Details
Published inProceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2012 pp. 297 - 299
Main Authors Pflanzl, W. C., Seebacher, E.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.05.2012
Subjects
1/f noise
1f noise
Electrical resistance measurement
Noise measurement
poly resistor
Resistance
Resistors
Temperature measurement
temperature modeling
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Summary:This paper presents the 1/f noise behaviour over a temperature range from -50°C to +200°C for poly resistor devices with sheet resistance 50 Ω/□ and 1.2 kΩ/□. Based on statistical measurement data a classical approach of 2th order is used to model the flicker noise characterization data as function of temperature with sufficient accuracy.
ISBN:1457720922
9781457720925