The test generation for pulse-induced crosstalk faults

It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.

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Published in2011 11th International Conference The Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) pp. 142 - 144
Main Authors Skobtsov, Y A, Skobtsov, V Y, Nasser, I K M
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.02.2011
Subjects
Circuit faults
Crosstalk
Crosstalk fault
Delay
Genetic algorithms
Integrated circuit modeling
test generation
Testing
Very large scale integration
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Abstract It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.
AbstractList It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.
Author Nasser, I K M
Skobtsov, Y A
Skobtsov, V Y
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  givenname: I K M
  surname: Nasser
  fullname: Nasser, I K M
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Snippet It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application....
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StartPage 142
SubjectTerms Circuit faults
Crosstalk
Crosstalk fault
Delay
Genetic algorithms
Integrated circuit modeling
test generation
Testing
Very large scale integration
Title The test generation for pulse-induced crosstalk faults
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