The test generation for pulse-induced crosstalk faults

It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.

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Bibliographic Details
Published in2011 11th International Conference The Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) pp. 142 - 144
Main Authors Skobtsov, Y A, Skobtsov, V Y, Nasser, I K M
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.02.2011
Subjects
Circuit faults
Crosstalk
Crosstalk fault
Delay
Genetic algorithms
Integrated circuit modeling
test generation
Testing
Very large scale integration
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Summary:It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.
ISBN:9781457700422
1457700425