Energy storage in polymer laminate structures-aging and diagnostic approaches for life validation

Over the last decades, significant increases in passively insulated electronic's reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high power applications. This i...

Full description

Saved in:
Bibliographic Details
Published inProceedings of Conference on Electrical Insulation and Dielectric Phenomena - CEIDP '96 Vol. 2; pp. 803 - 807 vol.2
Main Authors Sarjeant, W.J., MacDougall, F.W., Larson, D.W.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1996
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Over the last decades, significant increases in passively insulated electronic's reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high power applications. This is particularly true for advanced capacitors for filtering and energy storage applications. Recent innovations in analysis of aging under near-inservice conditions and frequencies are applied to predicting, from fundamental principles and for the first time, both microscale and at-scale passive component performance and fault tolerance. In addition, voltage scaling issues that may drive overvoltage performance will be described in some detail.
ISBN:9780780335806
0780335805
DOI:10.1109/CEIDP.1996.564630