Energy storage in polymer laminate structures-aging and diagnostic approaches for life validation
Over the last decades, significant increases in passively insulated electronic's reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high power applications. This i...
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Published in | Proceedings of Conference on Electrical Insulation and Dielectric Phenomena - CEIDP '96 Vol. 2; pp. 803 - 807 vol.2 |
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Main Authors | , , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1996
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Subjects | |
Online Access | Get full text |
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Summary: | Over the last decades, significant increases in passively insulated electronic's reliability have been achieved through a combination of advanced manufacturing techniques, new materials, and diagnostic methodologies to provide requisite life-cycle reliability for high power applications. This is particularly true for advanced capacitors for filtering and energy storage applications. Recent innovations in analysis of aging under near-inservice conditions and frequencies are applied to predicting, from fundamental principles and for the first time, both microscale and at-scale passive component performance and fault tolerance. In addition, voltage scaling issues that may drive overvoltage performance will be described in some detail. |
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ISBN: | 9780780335806 0780335805 |
DOI: | 10.1109/CEIDP.1996.564630 |