Measurement of electro-refraction in GaAs/AlGaAs multiple quantum well waveguide structures
Presents a direct approach to precisely measure changes in refractive index (/spl Delta/n) of GaAs/AlGaAs Multiple Quantum Well (MQW) wave guide structures as a function of applied electric field across the MQW layers. The results of /spl Delta/n(E) are useful for developing electro-optic quantum we...
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Published in | Proceedings of 20th Biennial Conference on Precision Electromagnetic Measurements pp. 247 - 248 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
1996
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Subjects | |
Online Access | Get full text |
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Summary: | Presents a direct approach to precisely measure changes in refractive index (/spl Delta/n) of GaAs/AlGaAs Multiple Quantum Well (MQW) wave guide structures as a function of applied electric field across the MQW layers. The results of /spl Delta/n(E) are useful for developing electro-optic quantum well devices. |
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ISBN: | 0780333764 9780780333765 |
DOI: | 10.1109/CPEM.1996.547054 |