Measurement of electro-refraction in GaAs/AlGaAs multiple quantum well waveguide structures

Presents a direct approach to precisely measure changes in refractive index (/spl Delta/n) of GaAs/AlGaAs Multiple Quantum Well (MQW) wave guide structures as a function of applied electric field across the MQW layers. The results of /spl Delta/n(E) are useful for developing electro-optic quantum we...

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Bibliographic Details
Published inProceedings of 20th Biennial Conference on Precision Electromagnetic Measurements pp. 247 - 248
Main Authors ur-Rahman, H., Langer, D.W.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1996
Subjects
Absorption
Electric variables measurement
Gallium arsenide
Molecular beam epitaxial growth
Pump lasers
Quantum well devices
Refractive index
Shape measurement
Voltage
Waveguide lasers
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Summary:Presents a direct approach to precisely measure changes in refractive index (/spl Delta/n) of GaAs/AlGaAs Multiple Quantum Well (MQW) wave guide structures as a function of applied electric field across the MQW layers. The results of /spl Delta/n(E) are useful for developing electro-optic quantum well devices.
ISBN:0780333764
9780780333765
DOI:10.1109/CPEM.1996.547054