Experimental analysis of two measurement techniques to characterize photodiode linearity

As photodiodes become more linear, accurately characterizing their linearity becomes very challenging. We compare the IMD3 results from a standard two tone measurement to those from a more complex three tone measurement technique. A Ge n-i-p waveguide photodetector on Silicon-on-Insulator (SOI) subs...

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Bibliographic Details
Published in2009 International Topical Meeting on Microwave Photonics pp. 1 - 4
Main Authors Ramaswamy, A., Nunoya, N., Piels, M., Johansson, L.A., Coldren, L.A., Bowers, J.E., Hastings, A.S., Williams, K.J., Klamkin, J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 01.10.2009
Subjects
Artificial neural networks
Biological neural networks
Dielectric substrates
Linearity
Measurement techniques
Microstrip antennas
Neural networks
Neurons
Patch antennas
Photodiodes
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Summary:As photodiodes become more linear, accurately characterizing their linearity becomes very challenging. We compare the IMD3 results from a standard two tone measurement to those from a more complex three tone measurement technique. A Ge n-i-p waveguide photodetector on Silicon-on-Insulator (SOI) substrate is used for the comparison. Additionally, we analyze, via simulation, the limitations of the measurement system in determining the distortion of highly linear photodiodes.
ISBN:1424447887
9781424447886