A determination of the Avogadro constant

We have determined the Avogadro constant N/sub A/ from measurements of the (220) lattice spacing, density, and molar mass of high-purity and near-perfect silicon single crystals.< >

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Bibliographic Details
Published inProceedings of Conference on Precision Electromagnetic Measurements Digest pp. 506 - 507
Main Authors Basile, G., Bergamin, A., Cavagnero, G., Mana, G., Mosca, M., Pasin, W., Panciera, R., Pettorruso, S., Peuto, A., Sacconi, A., Becker, P., Bettin, H., Kuetgens, U., De Bievre, P., Valkiers, S., Vittone, E., Zosi, G.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1994
Subjects
Atomic measurements
Crystalline materials
Crystals
Density measurement
Electric variables measurement
Lattices
Metrology
Particle measurements
Silicon
Testing
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Summary:We have determined the Avogadro constant N/sub A/ from measurements of the (220) lattice spacing, density, and molar mass of high-purity and near-perfect silicon single crystals.< >
ISBN:0780319842
9780780319844
DOI:10.1109/CPEM.1994.333193