Fault coverage and yield predictions: do we need more than 100% coverage?

The influence of non-random defect distributions and of non-modelled faults on the behavior of the cumulative chip fallout as a function of the cumulative fault coverage is discussed. The theory is applied to published yield data and a novel explanation of the deviation of these data from the classi...

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Bibliographic Details
Published inProceedings ETC 93 Third European Test Conference pp. 180 - 187
Main Author Huisman, L.M.
Format Conference Proceeding
LanguageEnglish
Published IEEE Comput. Soc. Press 1993
Subjects
Arc discharges
Logic testing
Poisson equations
Probability
Random processes
Semiconductor device modeling
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Summary:The influence of non-random defect distributions and of non-modelled faults on the behavior of the cumulative chip fallout as a function of the cumulative fault coverage is discussed. The theory is applied to published yield data and a novel explanation of the deviation of these data from the classical Williams-Brown theory is presented.< >
ISBN:0818633603
9780818633607
DOI:10.1109/ETC.1993.246519