Can supply current monitoring be applied to the testing of analogue as well as digital portions of mixed ASICs?

Investigations are made into the suitability of supply current monitoring as a technique for the testing of analogue circuit modules. Iddq monitoring is already recognised in the digital field. The possibility of a unified testing approach for mixed ASICs is raised. The potential effectiveness of th...

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Bibliographic Details
Published in[1992] Proceedings The European Conference on Design Automation pp. 538 - 542
Main Authors Camplin, D.A., Bell, I.M., Taylor, G.E., Bannister, B.R.
Format Conference Proceeding
LanguageEnglish
Published IEEE Comput. Soc. Press 1992
Subjects
Automatic test pattern generation
Circuit faults
Circuit testing
Costs
Current supplies
Design for testability
Electrical fault detection
Fault detection
Monitoring
Transient response
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Summary:Investigations are made into the suitability of supply current monitoring as a technique for the testing of analogue circuit modules. Iddq monitoring is already recognised in the digital field. The possibility of a unified testing approach for mixed ASICs is raised. The potential effectiveness of the method is investigated. Simulation results are reported to illustrate typical supply current levels for nominal and defective circuits. Analogue fault detection by this technique is compared with detection by observation of the circuit's output.< >
ISBN:0818626453
9780818626456
DOI:10.1109/EDAC.1992.205994