A study on signature analyzer for design for test (DFT)

This paper takes a look at the use of linear feedback shift registers (LFSRs) as test pattern generators (TPGs) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of...

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Bibliographic Details
Published in2004 IEEE International Conference on Semiconductor Electronics p. 5 pp.
Main Authors Abu Khari bin A'ain, Lim, C.T., Kok Hong Ng, Sheng Kwang Ng, Liew Eng Yew
Format Conference Proceeding
LanguageEnglish
Published IEEE 2004
Subjects
ATPG
Automatic test pattern generation
Automatic testing
BIST
Built-in self-test
Circuit faults
Circuit testing
Design for testability
LFSR
Linear feedback shift registers
Pattern analysis
PRBS
System testing
Test pattern generators
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Summary:This paper takes a look at the use of linear feedback shift registers (LFSRs) as test pattern generators (TPGs) and signature analyzers for built-in self-test (BIST). We also propose a method to generate pseudorandom test patterns. The proposed method can generate longer sequences of the same set of test patterns.
ISBN:9780780386587
0780386582
DOI:10.1109/SMELEC.2004.1620855