Complex Dielectric Measurements of Materials at Q- Band, V- Band and W- Band Frequencies with High Power Sources

In this paper we present a systematic study of complex dielectric permittivity of various semiconductor and dielectric materials, including highly absorbing substances, in Q-, V- and W-band frequencies. The measurements have been done using broadband quasi-optical millimeter wave spectrometer with a...

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Published in2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Vol. 1; pp. 82 - 87
Main Authors Afsar, M.N., Korolev, K.A., Subramanian, L., Tkachov, I.I.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2005
Subjects
Dielectric materials
Dielectric measurements
Frequency
Millimeter wave measurements
Millimeter wave technology
Oscillators
Permittivity measurement
Power measurement
Semiconductor materials
Spectroscopy
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Summary:In this paper we present a systematic study of complex dielectric permittivity of various semiconductor and dielectric materials, including highly absorbing substances, in Q-, V- and W-band frequencies. The measurements have been done using broadband quasi-optical millimeter wave spectrometer with a backward-wave oscillator (BWO) as a non-destructive high power tunable source of coherent radiation. Values of real and imaginary parts of dielectric permittivity of materials are calculated from the transmittance spectra. Refractive index data, obtained using both unbalanced waveguide bridge technique and free space measurements have been compared with previously published results. Millimeter wave and terahertz imaging and spectroscopy with high power BWO tubes as sources of coherent radiation for security applications have been briefly discussed
ISBN:9780780388796
0780388798
ISSN:1091-5281
DOI:10.1109/IMTC.2005.1604073