Automatic System Level Test a Fault Location for Large Digital Systems

A system for automatic test generation and fault location, FLT-700, is described in this paper. It can treat large digital systems with 100K blocks (logic gates) or more. This is realized by utilizing Scan-Path concept, automatic partitioning and test generation techniques and automatic fault locati...

Full description

Saved in:
Bibliographic Details
Published in15th Design Automation Conference pp. 347 - 352
Main Authors Yamada, A., Wakatsuki, N., Fukui, T., Funatsu, S.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1978
Subjects
Automatic testing
Circuit faults
Circuit testing
Digital systems
Fault location
Flip-flops
Logic circuits
Logic testing
System testing
Test pattern generators
Online AccessGet full text

Cover

More Information
Summary:A system for automatic test generation and fault location, FLT-700, is described in this paper. It can treat large digital systems with 100K blocks (logic gates) or more. This is realized by utilizing Scan-Path concept, automatic partitioning and test generation techniques and automatic fault location technique. Serviceability for large computer systems can, therefore, be improved and easy maintenance realized.
DOI:10.1109/DAC.1978.1585196