Process variability characterization and interconnect modeling
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Published in | Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005 pp. 586 - 587 |
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Main Authors | , |
Format | Conference Proceeding |
Language | English |
Published |
IEEE
2005
|
Subjects | |
Online Access | Get full text |
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ISBN: | 9780780390232 0780390237 |
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ISSN: | 0886-5930 2152-3630 |
DOI: | 10.1109/CICC.2005.1568737 |