X-ray response characterization of Y/sub 2/O/sub 2/S:Tb-CdS layered semiconductor

• Published in: IEEE Symposium Conference Record Nuclear Science 2004 Vol. 7; pp. 4506 - 4509 Vol. 7
• Main Authors: Ji-Koon Park, Sang-Sik Knag, Byung-Youl Cha, Sung-Ho Cho, So-Yeong Kim, Sang-Hee Nam, Hyung-Won Lee, Heung-Rae Cho, Sung-Kawng Park
• Format: Conference Proceeding
• Language: English
• Published: IEEE 2004
• Subjects: Optical imaging; Phosphors; Photodetectors; Powders; Scanning electron microscopy; Spatial resolution; X-ray detectors; X-ray diffraction; X-ray imaging; X-ray scattering
• ISBN: 9780780387003; 0780387007
• ISSN: 1082-3654; 2577-0829
• DOI: 10.1109/NSSMIC.2004.1466884

Phosphors coupled with photodetectors have been widely used in digital X-ray imaging applications. Some of the advantages of using phosphor films include X-ray conversion efficiency, spatial resolution, and integration with the imaging array. In this paper, the experimental studies of the Y/sub 2/O/sub 2/S:Tb synthesis, deposition, and characterization are reported on. Y/sub 2/O/sub 2/S:Tb powder was characterized in terms of scanning electron microscopy (SEM), X-ray diffraction (XRD), luminescence spectroscopy, and X-ray conversion efficiency. In addition, a Y/sub 2/O/sub 2/S:Tb layer was formed on cadmium sulphide (CdS) for the hybrid X-ray detector structure. The evaluation of the Y/sub 2/O/sub 2/S:Tb-CdS detector was performed by determining the leakage current, X-ray sensitivity, and linearity with respect to X-ray exposure dose. The results of the study made on the two-layered detector are compared with those from a conventional amorphous selenium (a-Se) detector.