Growth-rate induced defects in GaSb

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Bibliographic Details
Published inThe Fifth International Conference on Advanced Semiconductor Devices and Microsystems, 2004. ASDAM 2004 pp. 259 - 262
Main Authors Kindl, D., Hubik, P., Kristofik, J., Mares, J.J., Hulicius, E., Pangrac, J., Melichar, K., Jurka, V., Vyborny, Z., Touskova, J.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2004
Subjects
Epitaxial growth
Epitaxial layers
Mathematics
Molecular beam epitaxial growth
P-n junctions
Phase measurement
Physics
Spectroscopy
Substrates
Transient analysis
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ISBN:0780383357
DOI:10.1109/ASDAM.2004.1441210