Nanomotion measurement by phase conjugate interferometry

A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.

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Bibliographic Details
Published inConference on Lasers and Electro-Optics, 2004. (CLEO) Vol. 1; p. 2 pp. vol.1
Main Authors Kurtz, R.M., Pradhan, R.D., Aye, T.M., Savant, G.D., Klein, M.V.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2004
Subjects
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