Nanomotion measurement by phase conjugate interferometry

A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.

Saved in:
Bibliographic Details
Published inConference on Lasers and Electro-Optics, 2004. (CLEO) Vol. 1; p. 2 pp. vol.1
Main Authors Kurtz, R.M., Pradhan, R.D., Aye, T.M., Savant, G.D., Klein, M.V.
Format Conference Proceeding
LanguageEnglish
Published IEEE 2004
Subjects
Online AccessGet full text

Cover

Loading…
Abstract A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.
AbstractList A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer distances than the current state of the art with no loss in accuracy.
Author Savant, G.D.
Kurtz, R.M.
Klein, M.V.
Pradhan, R.D.
Aye, T.M.
Author_xml – sequence: 1
  givenname: R.M.
  surname: Kurtz
  fullname: Kurtz, R.M.
  organization: Electro-Optics & Holography Div., Phys. Opt. Corp., Torrance, CA, USA
– sequence: 2
  givenname: R.D.
  surname: Pradhan
  fullname: Pradhan, R.D.
  organization: Electro-Optics & Holography Div., Phys. Opt. Corp., Torrance, CA, USA
– sequence: 3
  givenname: T.M.
  surname: Aye
  fullname: Aye, T.M.
  organization: Electro-Optics & Holography Div., Phys. Opt. Corp., Torrance, CA, USA
– sequence: 4
  givenname: G.D.
  surname: Savant
  fullname: Savant, G.D.
  organization: Electro-Optics & Holography Div., Phys. Opt. Corp., Torrance, CA, USA
– sequence: 5
  givenname: M.V.
  surname: Klein
  fullname: Klein, M.V.
  organization: Electro-Optics & Holography Div., Phys. Opt. Corp., Torrance, CA, USA
BookMark eNp9yb0KwjAUhuGACv7lClxyA4JtSE87i-Lk5F6ifNUUc1KSdOjd6-DsuzzDuxZzDoyZkA3VhTFkSiKqlkKm1B--6cZoKleivloOPmQXWHnYNEZ4cFb3SQ0vm6AegfvxaTOU44zYIQaPHKetWHT2nSB_bsTufLodL3sHoB2i8zZObaGrwjSk_98PC8Qz7g
ContentType Conference Proceeding
DBID 6IE
6IH
CBEJK
RIE
RIO
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Proceedings Order Plan (POP) 1998-present by volume
IEEE Xplore All Conference Proceedings
IEEE Electronic Library Online
IEEE Proceedings Order Plans (POP) 1998-present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library Online
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Applied Sciences
ExternalDocumentID 1361597
Genre orig-research
GroupedDBID 6IE
6IH
6IK
6IL
AAJGR
AAVQY
ALMA_UNASSIGNED_HOLDINGS
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CBEJK
IERZE
OCL
RIE
RIL
RIO
ID FETCH-ieee_primary_13615973
IEDL.DBID RIE
ISBN 9781557527776
1557527776
IngestDate Wed Jun 26 19:26:38 EDT 2024
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-ieee_primary_13615973
ParticipantIDs ieee_primary_1361597
PublicationCentury 2000
PublicationDate 20040000
PublicationDateYYYYMMDD 2004-01-01
PublicationDate_xml – year: 2004
  text: 20040000
PublicationDecade 2000
PublicationTitle Conference on Lasers and Electro-Optics, 2004. (CLEO)
PublicationTitleAbbrev CLEO
PublicationYear 2004
Publisher IEEE
Publisher_xml – name: IEEE
SSID ssj0000395372
Score 2.695968
Snippet A new interferometer design for measuring nanometer-level motion is presented. Experiments show that this new design enables motion measurement at much longer...
SourceID ieee
SourceType Publisher
StartPage 2 pp. vol.1
SubjectTerms Distance measurement
Laser beams
Lighting
Mirrors
Motion measurement
Nonlinear optics
Optical interferometry
Optical mixing
Optical sensors
Phase measurement
Title Nanomotion measurement by phase conjugate interferometry
URI https://ieeexplore.ieee.org/document/1361597
Volume 1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV2xTsMwED21nZgKtAgoIA-MOCQ46cUzoqqQQAwgdatyjiMEalKFZGi_HjsOqUAd2GwP55Ms-_me754BrlGJ0L7W8YSikIcqCzjJJOXaRFtIWqTo1D6fp_O38HERLXpw09XCaK2b5DPt2Wbzlp8WqrZU2W0gDP5K7EMfpXS1Wh2f4gsZCbSBl0FIjO4QcdpKOnX9Xz-oNAAyG8LTz9Qub-TTqyvy1PaPKuN_fTuE8a5Uj710IHQEPZ0fw7C9W7J2536NIDbHaOG-7GGrHS_IaMPW7wbJmImLP2rLqTGrIFEa28VKV-VmDJPZw-v9nFtnlmsnTrFs_RAnMMiLXJ8CC-PMV4FERaRMtJglipS5qMVp6hMmpM5gtM_C-f7hCRy45BXLQlzAoCprfWlwuaKrZkG-AS8Xkts
link.rule.ids 310,311,783,787,792,793,799,4057,4058,55086
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV09T8MwED2VMsBUoEVA-fDASEKCkziZEVWAtmIoUrco5zhCoCZVSIby62vHaSpQBzbbg32SZb-757tngFvGqaNe64wYXcdweGobGMSJIWS0xVDQhGm1z6kXvjsvc3fegbu2FkYIUSefCVM167f8JOeVosrubSrxN2B7sC_9at_T1Voto2LRwKVMhV4SI5n7wBjzGlGntv_rD5UaQkY9mGwW15kjX2ZVosl__ugy_te6Ixhsi_XIWwtDx9AR2Qn0Gu-SNGf3uw--vEhz_WkPWWyZQYIrsvyQWEZkZPxZKVaNKA2JQs6dL0RZrAYwHD3NHkNDGRMttTxF1NhBT6Gb5Zk4A-L4qcXtgHFELuPFNObIpavmJ4mFLEZ-Dv1dM1zsHr6Bg3A2GUfj5-nrEA51KoviJC6hWxaVuJIoXeJ1vTlrC6mWJg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=Conference+on+Lasers+and+Electro-Optics%2C+2004.+%28CLEO%29&rft.atitle=Nanomotion+measurement+by+phase+conjugate+interferometry&rft.au=Kurtz%2C+R.M.&rft.au=Pradhan%2C+R.D.&rft.au=Aye%2C+T.M.&rft.au=Savant%2C+G.D.&rft.date=2004-01-01&rft.pub=IEEE&rft.isbn=9781557527776&rft.volume=1&rft.spage=2+pp.+vol.1&rft.externalDocID=1361597
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781557527776/lc.gif&client=summon&freeimage=true
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781557527776/mc.gif&client=summon&freeimage=true
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=9781557527776/sc.gif&client=summon&freeimage=true