Imaging Performance of a Phase-contrast X-ray Imaging System with a Silicon-based Photon Counting X-ray Detector

• Published in: IEEE conference record - Nuclear Science Symposium & Medical Imaging Conference. p. 1
• Main Author: Han, L.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 26.10.2024
• Subjects: Imaging; Micrometers; Microwave integrated circuits; Semiconductor detectors; Sensitivity; Silicon; X-ray detectors
• ISSN: 2577-0829
• DOI: 10.1109/NSS/MIC/RTSD57108.2024.10657890

We present imaging performance of a phase contrast X-ray imaging system constructed by an innovative silicon-based photon counting X-ray detector and a microfocus X-ray tube. The developed propagation-based phase contrast imaging system without grating involves a super-large area flat-panel silicon based photon counting X-ray detector and a microfocus X-ray tube with a minimal focal size of five micron meter. According to the principle of coaxial phase contrast, phase differences of the imaging subject are generated by detection at specific detecting locations. The phase information is extracted from a series of back-projection images. The detailed phase contrast image is then acquired. To obtain high-resolution and high sensitivity phase contrast imaging, the system uses a up-to-date silicon base photon counting flat-panel detector, which pixel size is 70 micron, thickness of silicon x-ray sensitive layer is 700 micron, and the counting rate of pixels is 2.6 \mathrm{E}^{6}. Comparing with conventional absorption-contrast imaging, the presented phase-contrast system has better performances and enhanced phase contrasting details, especially for imaging biological samples with soft issues of low densities.