Novel SiO2 Cables With Edge Launch Connectors for High Temperature RF Measurements

• Published in: 2024 IEEE 74th Electronic Components and Technology Conference (ECTC) pp. 1981 - 1985
• Main Authors: Alshatnawi, Firas, Umar, Ashraf, Enakerakpo, Emuobosan, Abdelatty, Mohamed Youssef, Alshaibani, WT, Al-Haidari, Riadh, Alhendi, Mohammed, Shaddock, David, Borgesen, Peter, Poliks, Mark D.
• Format: Conference Proceeding
• Language: English
• Published: IEEE 28.05.2024
• Subjects: Connectors; Coplanar waveguides; edge launch connectors; high temperature electronics; MIM capacitors; printed electronics; Radio frequency; Silicon compounds; Temperature distribution; Temperature measurement
• ISSN: 2377-5726
• DOI: 10.1109/ECTC51529.2024.00336

In the relentless pursuit of expanding the boundaries of what is achievable under extreme temperature conditions, the precise measurement of RF signals becomes crucial. The ability to capture and analyze RF data in environments with high temperatures not only improves operational efficiency and reliability but also opens up new avenues for scientific investigation. This research introduces a innovative advancement in the field of high-temperature electronics: high-temperature SiO 2 cables equipped with edge launch connectors. These connectors represent a significant advancement in high-temperature electronics, as they are specifically engineered to withstand elevated temperatures, boasting an impressive resilience of up to 600°C. This exceptional temperature tolerance makes them invaluable assets in industries where electronic components are exposed to extreme heat conditions. To verify their performance, the RF characteristics of Coplanar Waveguide (CPW) lines and Metal-Insulator-Metal (MIM) capacitors were evaluated using the innovative SiO 2 cables and edge launch connectors. Remarkably, these connectors demonstrated outstanding performance, maintaining both their structural integrity and RF functionality even after being subjected to temperatures of up to 600°C for three complete cycles, with no signs of degradation observed. This outcome underscores the durability and reliability of these state-of-the-art connectors, positioning them as indispensable instruments for high-temperature RF measurements.