Coupled effects of electronic and nuclear energy deposition in UO 2 crystals: a high-resolution XRD study carried out at the MARS beamline of the SOLEIL synchrotron facility
For the first time at the SOLEIL synchrotron facility's MARS beamline, UO2 single-crystal-like samples underwent characterization, and strain depth profiles were established. Single crystals oriented along (110) and (111) were submitted to ion irradiation in the nuclear energy-loss regime (Sn)...
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Published in | Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 557 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier
01.12.2024
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Subjects | |
Online Access | Get full text |
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Summary: | For the first time at the SOLEIL synchrotron facility's MARS beamline, UO2 single-crystal-like samples underwent characterization, and strain depth profiles were established. Single crystals oriented along (110) and (111) were submitted to ion irradiation in the nuclear energy-loss regime (Sn) using 900 keV I2+ ions, and also with concomitant electronic energy deposition (Se) using 27 MeV Fe9+ ions. X-ray diffraction measurements were conducted at the MARS beamline, specialized for radioactive material analysis. High-angular-resolution reciprocal space maps around asymmetrical reflections and conventional symmetrical θ/2θ scans were recorded. Analysis with the RaDMaX software allowed retrieving the strain depth profiles. Results reveal that the Sn-irradiated surface layer exhibits tensile strain along its normal with no in-plane strain, that this normal strain is partially relaxed by Se. Both crystal orientations display similar behavior, but not with the same magnitude. Comparison with polycrystals indicates a more pronounced strain relaxation in the latter case. |
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ISSN: | 1872-9584 0168-583X |
DOI: | 10.1016/j.nimb.2024.165491 |