Imaging nanomechanical vibrations and manipulating parametric mode coupling via scanning microwave microscopy

• Published in: Nano letters Vol. 24; no. 28; pp. 8550 - 8557
• Main Authors: Xu, Hao, Venkatachalam, Srisaran, Rabenimanana, Toky Harrison, Boyaval, Christophe, Eliet, Sophie, Braud, Flavie, Collin, Eddy, Theron, Didier, Zhou, Xin
• Format: Journal Article
• Language: English
• Published: American Chemical Society 2024
• Subjects: Engineering Sciences; Instrumentation and Detectors; Mechanics; Micro and nanotechnologies; Microelectronics; Physics; Vibrations
• ISSN: 1530-6984; 1530-6992
• DOI: 10.1021/acs.nanolett.4c01401

In this study, we present a novel platform based on scanning microwave microscopy for manipulating and detecting tiny vibrations of nanoelectromechanical resonators using a single metallic tip. The tip is placed on the top of a grounded silicon nitride membrane, acting as a movable top gate of the coupled resonator. We demonstrate its ability to map mechanical modes and investigate mechanical damping effects in a capacitive coupling scheme, based on its spatial resolution. We also manipulate the energy transfer coherently between the mode of the scanning tip and the underlying silicon nitride membrane, via parametric coupling. Typical features of optomechanics, such as anti-damping and electromechanically induced transparency, have been observed. Since the microwave optomechanical technology is fully compatible with quantum electronics and very low temperature conditions, it should provide a powerful tool for studying phonon tunnelling between two spatially separated vibrating elements, which could potentially be applied to quantum sensing.