A Pre-Scan Method to Accelerate Near-Field Scan Immunity Tests

Near Field Scan Immunity (NFSI) is a powerful measurement method to diagnose susceptibility issues at printed circuit board (PCB) and integrated circuits (IC) levels. However, one limitation of this approach is the excessive measurement time required to build the susceptibility maps, which reveals t...

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Bibliographic Details
Published inIEEE journal on electromagnetic compatibility practice and applications p. 1
Main Authors Boyer, Alexandre, Caignet, Fabrice
Format Journal Article
LanguageEnglish
Published IEEE 01.02.2024
Subjects
Engineering Sciences
Time optimization
Pre-scan
Near Field Scan Immunity
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Summary:Near Field Scan Immunity (NFSI) is a powerful measurement method to diagnose susceptibility issues at printed circuit board (PCB) and integrated circuits (IC) levels. However, one limitation of this approach is the excessive measurement time required to build the susceptibility maps, which reveals the sensitive pins or traces of the device under test. This letter presents a pre-scan method based on a large-band injection in order to determine rapidly the more relevant scanning positions, the frequency range of interests and an estimation of the susceptibility level on each scanning position. The pre-scan provides the configuration parameters of the full NFSI scan in order to keep an acceptable test duration.
ISSN:2637-6423
2637-6423
DOI:10.1109/LEMCPA.2024.3363113