SUBSTRATE PROCESSING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, PROGRAM, AND SUBSTRATE PROCESSING APPARATUS

Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a...

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Main Authors KAGA, Yukinao, KURIBAYASHI, Koei
Format Patent
LanguageEnglish
French
Japanese
Published 03.10.2024
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Abstract Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a second raw material gas and the reaction gas to the substrate after (a). L'invention concerne une technique qui permet d'améliorer les caractéristiques d'un film à former sur un substrat. Ce procédé comprend : (a) une étape consistant à déposer un film en fournissant au substrat un premier gaz de matière première et un gaz de réaction ; et (b) une étape consistant à graver le substrat en fournissant au substrat un second gaz de matière première et le gaz de réaction après l'étape (a). 基板上に形成する膜の特性を向上させることが可能な技術を提供する。 (a)基板に第1原料ガスと反応ガスを供給することにより成膜する工程と、(b)(a)の後で、前記基板に第2原料ガスと前記反応ガスを供給することによりエッチングする工程とを有する。
AbstractList Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a second raw material gas and the reaction gas to the substrate after (a). L'invention concerne une technique qui permet d'améliorer les caractéristiques d'un film à former sur un substrat. Ce procédé comprend : (a) une étape consistant à déposer un film en fournissant au substrat un premier gaz de matière première et un gaz de réaction ; et (b) une étape consistant à graver le substrat en fournissant au substrat un second gaz de matière première et le gaz de réaction après l'étape (a). 基板上に形成する膜の特性を向上させることが可能な技術を提供する。 (a)基板に第1原料ガスと反応ガスを供給することにより成膜する工程と、(b)(a)の後で、前記基板に第2原料ガスと前記反応ガスを供給することによりエッチングする工程とを有する。
Author KURIBAYASHI, Koei
KAGA, Yukinao
Author_xml – fullname: KAGA, Yukinao
– fullname: KURIBAYASHI, Koei
BookMark eNrjYmDJy89L5WQoDg51Cg4JcgxxVQgI8nd2DQ729HNX8HUN8fB30YHSCm7-QSBZl1BnkGSwq6-ns78fkBcCFHdxDfN0dtUBybsHOfrqKDj6uShgNdQxIMARKBYazMPAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4sP9jQyMTIwMDM1MzB0NjYlTBQAWTzu3
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
DocumentTitleAlternate PROCÉDÉ DE TRAITEMENT DE SUBSTRAT, PROCÉDÉ DE PRODUCTION D'UN DISPOSITIF À SEMI-CONDUCTEUR, PROGRAMME ET APPAREIL DE TRAITEMENT DE SUBSTRAT
基板処理方法、半導体装置の製造方法、プログラムおよび基板処理装置
ExternalDocumentID WO2024201647A1
GroupedDBID EVB
ID FETCH-epo_espacenet_WO2024201647A13
IEDL.DBID EVB
IngestDate Fri Oct 18 06:09:04 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
French
Japanese
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_WO2024201647A13
Notes Application Number: WO2023JP12155
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241003&DB=EPODOC&CC=WO&NR=2024201647A1
ParticipantIDs epo_espacenet_WO2024201647A1
PublicationCentury 2000
PublicationDate 20241003
PublicationDateYYYYMMDD 2024-10-03
PublicationDate_xml – month: 10
  year: 2024
  text: 20241003
  day: 03
PublicationDecade 2020
PublicationYear 2024
RelatedCompanies KOKUSAI ELECTRIC CORPORATION
RelatedCompanies_xml – name: KOKUSAI ELECTRIC CORPORATION
Score 3.704621
Snippet Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title SUBSTRATE PROCESSING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, PROGRAM, AND SUBSTRATE PROCESSING APPARATUS
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241003&DB=EPODOC&locale=&CC=WO&NR=2024201647A1
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5KFfWmVfFRJaDk1GDNq9lDkXR32yrkQZvU3kpeBUXaYiP-fWeXVHuQnrI7A0MyZHb2250HwL1oG0LsPNMK0y40k7RTjZBU13JnnhTioN-wRe6w59vD2HyZWtMafGxyYWSd0G9ZHBEtKkN7L-V6vfo7xGIytnL9kL4hafnUj7pMrdAxuiP8S1XW6_IwYAFVKUXcpvojydNl8SwXsdIebqQ7IgCMT3oiL2W17VT6x7AforxFeQK196QBh3TTe60BB1515Y3DyvrWp7Aexz3R4zjiSjgKqFgI_YHi8WgYsFb1VBDVCS6LqWCOhZoDH2cR0hmfPFPeEvzByPVaiusz5V-hbhi6SIvHZ3DX5xEdavj2s19lzV6D7U81zqG-WC6KC1BSfe4Q00qsxLRMPcsdkubtzEDEkpNO8mhcQnOXpKvd7Gs4ElMZ5mY0oV5-fhU36K7L9FZq-QcarI9E
link.rule.ids 230,309,783,888,25578,76884
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4QNOJNUSOK2kTTE43Yl-2BmLJbKEofgRa5kb5INAaI1Pj3nd0U5WA4dTtfMmknOzv9tjszAHesbYipZ6mUq3ouqWY7kUwzkaXMmMc52-hXdJY77Hq6E6nPU21agY9NLgyvE_rNiyOiR6Xo7wVfr1d_m1iUn61c3ydvKFo-9cIOFUt2jOEIZ6lIux078KlPREKQt4neiGMyL55lIVfaw49sg1Xatyddlpey2g4qvSPYD1DfojiGyntchxrZ9F6rw4Fb_vLGYel96xNYj6Mu63Ec2kIw8glbCL2-4Nqh49NWeRWQ1TGURoSBY2Zm38O7EOXUngyI3WJ4f2S5LcHyqPCvUisILJRF41O47dkhcSR8-tmvsWav_varKmdQXSwX-TkIiTw3TFWLtVjVVDnNDDPJ2qmCjCUzH-MHpQHNXZoudsM3UHNCdzgbDryXSzhkED_ypjShWnx-5VcYuovkmlv8B_wgkjQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SUBSTRATE+PROCESSING+METHOD%2C+METHOD+FOR+PRODUCING+SEMICONDUCTOR+DEVICE%2C+PROGRAM%2C+AND+SUBSTRATE+PROCESSING+APPARATUS&rft.inventor=KAGA%2C+Yukinao&rft.inventor=KURIBAYASHI%2C+Koei&rft.date=2024-10-03&rft.externalDBID=A1&rft.externalDocID=WO2024201647A1