SUBSTRATE PROCESSING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, PROGRAM, AND SUBSTRATE PROCESSING APPARATUS
Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a...
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Format | Patent |
Language | English French Japanese |
Published |
03.10.2024
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Abstract | Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a second raw material gas and the reaction gas to the substrate after (a).
L'invention concerne une technique qui permet d'améliorer les caractéristiques d'un film à former sur un substrat. Ce procédé comprend : (a) une étape consistant à déposer un film en fournissant au substrat un premier gaz de matière première et un gaz de réaction ; et (b) une étape consistant à graver le substrat en fournissant au substrat un second gaz de matière première et le gaz de réaction après l'étape (a).
基板上に形成する膜の特性を向上させることが可能な技術を提供する。 (a)基板に第1原料ガスと反応ガスを供給することにより成膜する工程と、(b)(a)の後で、前記基板に第2原料ガスと前記反応ガスを供給することによりエッチングする工程とを有する。 |
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AbstractList | Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a second raw material gas and the reaction gas to the substrate after (a).
L'invention concerne une technique qui permet d'améliorer les caractéristiques d'un film à former sur un substrat. Ce procédé comprend : (a) une étape consistant à déposer un film en fournissant au substrat un premier gaz de matière première et un gaz de réaction ; et (b) une étape consistant à graver le substrat en fournissant au substrat un second gaz de matière première et le gaz de réaction après l'étape (a).
基板上に形成する膜の特性を向上させることが可能な技術を提供する。 (a)基板に第1原料ガスと反応ガスを供給することにより成膜する工程と、(b)(a)の後で、前記基板に第2原料ガスと前記反応ガスを供給することによりエッチングする工程とを有する。 |
Author | KURIBAYASHI, Koei KAGA, Yukinao |
Author_xml | – fullname: KAGA, Yukinao – fullname: KURIBAYASHI, Koei |
BookMark | eNrjYmDJy89L5WQoDg51Cg4JcgxxVQgI8nd2DQ729HNX8HUN8fB30YHSCm7-QSBZl1BnkGSwq6-ns78fkBcCFHdxDfN0dtUBybsHOfrqKDj6uShgNdQxIMARKBYazMPAmpaYU5zKC6W5GZTdXEOcPXRTC_LjU4sLEpNT81JL4sP9jQyMTIwMDM1MzB0NjYlTBQAWTzu3 |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences |
DocumentTitleAlternate | PROCÉDÉ DE TRAITEMENT DE SUBSTRAT, PROCÉDÉ DE PRODUCTION D'UN DISPOSITIF À SEMI-CONDUCTEUR, PROGRAMME ET APPAREIL DE TRAITEMENT DE SUBSTRAT 基板処理方法、半導体装置の製造方法、プログラムおよび基板処理装置 |
ExternalDocumentID | WO2024201647A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_WO2024201647A13 |
IEDL.DBID | EVB |
IngestDate | Fri Oct 18 06:09:04 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English French Japanese |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_WO2024201647A13 |
Notes | Application Number: WO2023JP12155 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241003&DB=EPODOC&CC=WO&NR=2024201647A1 |
ParticipantIDs | epo_espacenet_WO2024201647A1 |
PublicationCentury | 2000 |
PublicationDate | 20241003 |
PublicationDateYYYYMMDD | 2024-10-03 |
PublicationDate_xml | – month: 10 year: 2024 text: 20241003 day: 03 |
PublicationDecade | 2020 |
PublicationYear | 2024 |
RelatedCompanies | KOKUSAI ELECTRIC CORPORATION |
RelatedCompanies_xml | – name: KOKUSAI ELECTRIC CORPORATION |
Score | 3.704621 |
Snippet | Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
Title | SUBSTRATE PROCESSING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, PROGRAM, AND SUBSTRATE PROCESSING APPARATUS |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241003&DB=EPODOC&locale=&CC=WO&NR=2024201647A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LS8NAEB5KFfWmVfFRJaDk1GDNq9lDkXR32yrkQZvU3kpeBUXaYiP-fWeXVHuQnrI7A0MyZHb2250HwL1oG0LsPNMK0y40k7RTjZBU13JnnhTioN-wRe6w59vD2HyZWtMafGxyYWSd0G9ZHBEtKkN7L-V6vfo7xGIytnL9kL4hafnUj7pMrdAxuiP8S1XW6_IwYAFVKUXcpvojydNl8SwXsdIebqQ7IgCMT3oiL2W17VT6x7AforxFeQK196QBh3TTe60BB1515Y3DyvrWp7Aexz3R4zjiSjgKqFgI_YHi8WgYsFb1VBDVCS6LqWCOhZoDH2cR0hmfPFPeEvzByPVaiusz5V-hbhi6SIvHZ3DX5xEdavj2s19lzV6D7U81zqG-WC6KC1BSfe4Q00qsxLRMPcsdkubtzEDEkpNO8mhcQnOXpKvd7Gs4ElMZ5mY0oV5-fhU36K7L9FZq-QcarI9E |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV1LT8JAEJ4QNOJNUSOK2kTTE43Yl-2BmLJbKEofgRa5kb5INAaI1Pj3nd0U5WA4dTtfMmknOzv9tjszAHesbYipZ6mUq3ouqWY7kUwzkaXMmMc52-hXdJY77Hq6E6nPU21agY9NLgyvE_rNiyOiR6Xo7wVfr1d_m1iUn61c3ydvKFo-9cIOFUt2jOEIZ6lIux078KlPREKQt4neiGMyL55lIVfaw49sg1Xatyddlpey2g4qvSPYD1DfojiGyntchxrZ9F6rw4Fb_vLGYel96xNYj6Mu63Ec2kIw8glbCL2-4Nqh49NWeRWQ1TGURoSBY2Zm38O7EOXUngyI3WJ4f2S5LcHyqPCvUisILJRF41O47dkhcSR8-tmvsWav_varKmdQXSwX-TkIiTw3TFWLtVjVVDnNDDPJ2qmCjCUzH-MHpQHNXZoudsM3UHNCdzgbDryXSzhkED_ypjShWnx-5VcYuovkmlv8B_wgkjQ |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SUBSTRATE+PROCESSING+METHOD%2C+METHOD+FOR+PRODUCING+SEMICONDUCTOR+DEVICE%2C+PROGRAM%2C+AND+SUBSTRATE+PROCESSING+APPARATUS&rft.inventor=KAGA%2C+Yukinao&rft.inventor=KURIBAYASHI%2C+Koei&rft.date=2024-10-03&rft.externalDBID=A1&rft.externalDocID=WO2024201647A1 |