SUBSTRATE PROCESSING METHOD, METHOD FOR PRODUCING SEMICONDUCTOR DEVICE, PROGRAM, AND SUBSTRATE PROCESSING APPARATUS

Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a...

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Bibliographic Details
Main Authors KAGA, Yukinao, KURIBAYASHI, Koei
Format Patent
LanguageEnglish
French
Japanese
Published 03.10.2024
Subjects
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Summary:Provided is a technique whereby it is possible to improve the characteristics of a film to be formed on a substrate. This method includes: (a) a step of depositing a film by supplying a first raw material gas and a reaction gas to the substrate; and (b) a step of etching the substrate by supplying a second raw material gas and the reaction gas to the substrate after (a). L'invention concerne une technique qui permet d'améliorer les caractéristiques d'un film à former sur un substrat. Ce procédé comprend : (a) une étape consistant à déposer un film en fournissant au substrat un premier gaz de matière première et un gaz de réaction ; et (b) une étape consistant à graver le substrat en fournissant au substrat un second gaz de matière première et le gaz de réaction après l'étape (a). 基板上に形成する膜の特性を向上させることが可能な技術を提供する。 (a)基板に第1原料ガスと反応ガスを供給することにより成膜する工程と、(b)(a)の後で、前記基板に第2原料ガスと前記反応ガスを供給することによりエッチングする工程とを有する。
Bibliography:Application Number: WO2023JP12155