AUTOMATIC PROFILE GENERATION ON TEST MACHINE

• Main Authors: NAKAZATO, Jin, TAKAMI, Keisuke, TANAKA, Saki, KUCHITSU, Mitsuhiro, HORIUCHI, Haruka
• Format: Patent
• Language: English; French; Japanese
• Published: 04.01.2024
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

A test evaluation method according to the present disclosure includes: providing, on a virtual base, a first configuration for calculating actual data; setting a first measurement device for the first configuration; obtaining first data for the first configuration with the first measurement device;...