METHOD AND DEVICE FOR DETERMINING THE SURFACE QUALITY OF REFLECTIVE MATERIALS BASED ON IMAGE ANALYSIS

The invention provides a method and an apparatus for measuring the illuminance and luminosity of the surface of materials, based on capturing the image of a high contrast pattern reflected on said surface and analysing the distribution of the grey levels in the recorded image. La invención propone u...

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Bibliographic Details
Main Authors GALLERO REBOLLO, Enrique, GONZÁLEZ LEAL, Juan María
Format Patent
LanguageEnglish
French
Spanish
Published 04.01.2024
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:The invention provides a method and an apparatus for measuring the illuminance and luminosity of the surface of materials, based on capturing the image of a high contrast pattern reflected on said surface and analysing the distribution of the grey levels in the recorded image. La invención propone un método y un aparato para la medida de la luminancia y de la luminosidad de la superficie de materiales, basado en la captura de la imagen reflejada sobre esta superficie de un patrón de alto contraste y el análisis de la distribución de los niveles de grises de esta imagen registrada. L'invention concerne un procédé et un appareil pour la mesure de la luminance et de la luminosité de la surface de matériaux, sur la base de la capture de l'image réfléchie sur cette surface d'un modèle à haut contraste et de l'analyse de la distribution des niveaux de gris de cette image enregistrée.
Bibliography:Application Number: WO2023ES70421