KPI ANOMALY DETECTION METHOD AND APPARATUS, DEVICE AND MEDIUM

• Main Author: SU, Haiming
• Format: Patent
• Language: Chinese; English; French
• Published: 02.11.2023
• Subjects: CALCULATING; COMPUTING; COUNTING; ELECTRIC DIGITAL DATA PROCESSING; PHYSICS

The present application discloses a KPI anomaly detection method and apparatus, a device, and a medium, which are applied to the technical field of KPI anomalies. The method comprises: acquiring single-dimensional KPI time series data of a target interval, the length of the target interval being a first preset time length, and the end time point of the target interval being a specified time point; extracting a first data feature of the single-dimensional KPI time series data; inputting the first data feature into a base classifier, and outputting a preliminary anomaly detection result of the single-dimensional KPI time series data using the base classifier; extracting a second data feature of a target time point, and inputting the second data feature and the preliminary anomaly detection result into a label classifier to obtain a classification result, the target time point being any time point within a second preset time length after the specified time point; and determining a final anomaly detection result