MICRO LIGHT-EMITTING DIODE TEST SYSTEM AND TEST METHOD

• Main Authors: WANG, Wei, BI, Hai, DUAN, Jiangwei, ZHANG, Heming, YANG, Wanli, KE, Lianbao, HE, Zhaoming
• Format: Patent
• Language: Chinese; English; French
• Published: 19.10.2023
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

A micro light-emitting diode test system and a test method. The test system comprises a first light generation module (11) used for sending a first light signal to a plurality of micro light-emitting diodes (21) to be tested, so that the plurality of micro light-emitting diodes (21) to be tested generate second light signals; a hyperspectral camera (31), used for collecting the second light signals to obtain a spectral imaging frame, the spectral imaging frame comprising spectral data of each of the plurality of micro light-emitting diodes (21) to be tested; and a control module (41) connected to the hyperspectral camera (31) and used for determining, on the basis of the spectral imaging frame, a defective micro light-emitting diode from the plurality of micro light-emitting diodes (21) to be tested, wherein the plurality of micro light-emitting diodes (21) to be tested excite themselves after receiving light energy in the first light signal to generate the second light signals. Un système de test de micro-di