PROBE AND PROBE CARD

This probe is for use in testing a test subject by being inserted into a through hole of a guide plate, and the probe is provided with a columnar conductor part and a plurality of insulative covering materials arranged on a surface of the conductor part so as to be separated from each other along th...

Full description

Saved in:
Bibliographic Details
Main Authors HAYASHIZAKI Takayuki, SUTO Kenichi, KON Mizuho, NASU Mika, TOYODA Misaki
Format Patent
LanguageEnglish
French
Japanese
Published 22.09.2022
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Online AccessGet full text

Cover

More Information
Summary:This probe is for use in testing a test subject by being inserted into a through hole of a guide plate, and the probe is provided with a columnar conductor part and a plurality of insulative covering materials arranged on a surface of the conductor part so as to be separated from each other along the central axis of the conductor part. Sonde étant destinée à être utilisée pour tester un sujet d'essai en étant insérée dans un trou traversant d'une plaque de guidage, et la sonde étant dotée d'une partie conductrice en colonne et d'une pluralité de matériaux de revêtement isolants agencés sur une surface de la partie conductrice de manière à être séparés les uns des autres le long de l'axe central de la partie conductrice. ガイドプレートの貫通孔に挿入され、被検査体の検査に使用するプローブであって、プローブは、柱状の導体部と、導体部の表面に導体部の中心軸方向に沿って互いに離間して配置された複数の絶縁性の被覆材を備える。
Bibliography:Application Number: WO2022JP03027