ATOMIC FORCE MICROSCOPY TIPS FOR INTERCONNECTION
Embodiments relate to the design of an electronic device capable of preventing a lateral motion between a first body and a second body. The device comprises a first body comprising one or more atomic force microscopy (AFM) tips protruding from a first surface of the first body. The device further co...
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Main Authors | , , , , |
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Format | Patent |
Language | English French |
Published |
25.02.2021
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Subjects | |
Online Access | Get full text |
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Summary: | Embodiments relate to the design of an electronic device capable of preventing a lateral motion between a first body and a second body. The device comprises a first body comprising one or more atomic force microscopy (AFM) tips protruding from a first surface of the first body. The device further comprises a second body comprising one or more electrical contacts on a second surface of the second body. The second surface faces the first surface. The one or more electrical contacts pierced by the AFM tips of the first surface to prevent a lateral motion between the first body and the second body.
Des modes de réalisation concernent la conception d'un dispositif électronique capable d'empêcher un mouvement latéral entre un premier corps et un second corps. Le dispositif comprend un premier corps comprenant une ou plusieurs pointes de microscopie à force atomique (AFM) faisant saillie à partir d'une première surface du premier corps. Le dispositif comprend en outre un second corps comprenant un ou plusieurs contacts électriques sur une seconde surface du second corps. La seconde surface fait face à la première surface. Le ou les contacts électriques percés par les pointes AFM de la première surface empêchent un mouvement latéral entre le premier corps et le second corps. |
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Bibliography: | Application Number: WO2020US46260 |