RADIATION DETECTION SYSTEMS AND METHODS
A semiconductor device includes a semiconductor layer comprising a source region, a drain region, and a gate region disposed between the source and drain regions; and a gate stack disposed over the gate region of the semiconductor layer, the gate stack including a semiconductor layer disposed adjace...
Saved in:
Main Authors | , , |
---|---|
Format | Patent |
Language | English French |
Published |
12.11.2020
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | A semiconductor device includes a semiconductor layer comprising a source region, a drain region, and a gate region disposed between the source and drain regions; and a gate stack disposed over the gate region of the semiconductor layer, the gate stack including a semiconductor layer disposed adjacent a charge storage structure. A neutron sensitive structure is disposed around the semiconductor layer.
Un dispositif à semi-conducteur comprend une couche semi-conductrice comprenant une région de source, une région de drain et une région de grille disposée entre les régions de source et de drain; et un empilement de grille disposé sur la région de grille de la couche semi-conductrice, l'empilement de grille comprenant une couche semi-conductrice disposée adjacente à une structure de stockage de charge. Une structure sensible aux neutrons est disposée autour de la couche semi-conductrice. |
---|---|
Bibliography: | Application Number: WO2020US29369 |