CONDUCTIVE NANOWIRE MEASUREMENT

• Main Authors: SPAID, Michael, WOLK, Jeff
• Format: Patent
• Language: English; French
• Published: 08.10.2020
• Subjects: ADHESIVES; BASIC ELECTRIC ELEMENTS; CABLES; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; CHEMICAL PAINT OR INK REMOVERS; CHEMISTRY; COATING COMPOSITIONS, e.g. PAINTS, VARNISHES ORLACQUERS; CONDUCTORS; CORRECTING FLUIDS; DYES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; FILLING PASTES; INKS; INSULATORS; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; LAYERED PRODUCTS; LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT ORNON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; METALLURGY; MISCELLANEOUS APPLICATIONS OF MATERIALS; MISCELLANEOUS COMPOSITIONS; NANOTECHNOLOGY; NATURAL RESINS; PAINTS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; PERFORMING OPERATIONS; PHYSICS; POLISHES; PRINTED CIRCUITS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES; SEMICONDUCTOR DEVICES; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; TESTING; TRANSPORTING; USE OF MATERIALS THEREFOR; WOODSTAINS

A method of concurrently determining length and diameter of nanowires. Nanowires are provided onto a support. A chosen illumination of the nanowires on the support is provided. An image of the nanowires on the support is obtained. A length of each nanowire is calculated by an image processing program. A relative diameter of each nanowire is calculated based on an integrated intensity of light scattered per unit length from each nanowire. L'invention concerne un procédé de détermination simultanée de la longueur et du diamètre de nanofils. Des nanofils sont disposés sur un support. Un éclairage choisi des nanofils sur le support est fourni. Une image des nanofils sur le support est obtenue. Une longueur de chaque nanofil est calculée par un programme de traitement d'image. Un diamètre relatif de chaque nanofil est calculé sur la base d'une intensité intégrée de lumière diffusée par unité de longueur à partir de chaque nanofil.