APPARATUS FOR PROCESSING A WAFER, AND METHOD OF CONTROLLING SUCH AN APPARATUS

An apparatus for processing a wafer comprises: a rotatable chuck adapted to receive a wafer; a heating assembly comprising an array of heating elements arranged to heat a wafer received by the rotatable chuck; an image sensor arranged to detect electromagnetic radiation from a surface of the wafer;...

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Bibliographic Details
Main Authors KLEINDIENST, Martin, KOCH, Stefan
Format Patent
LanguageEnglish
French
Published 13.08.2020
Subjects
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