DEVICE SORTING APPARATUS

• Main Authors: YOU, Hong Jun, YOON, Young Seok
• Format: Patent
• Language: English; French; Korean
• Published: 26.12.2019
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

The present invention relates to a device sorting apparatus and, more particularly, to a device sorting apparatus which automatically sorts devices, such as semiconductor chips, according to sorting criteria. Disclosed is a device sorting apparatus comprising: a loading unit (100) on which a tray (30) having loaded thereon devices (10) to be inspected is to be loaded; a DC test unit (170) which receives the devices (10) to be inspected from the loading unit (100), for performing a DC test; an X-Y table (410) for moving, in the X-Y directions, a burn-in board (20) on which those of the devices (10) to be inspected that were tested and found to be good products by the DC test unit (17) are loaded in empty spaces from which devices (10) to be sorted have been withdrawn; an unloading unit (300) on which the devices (10) to be sorted, which have been withdrawn from the burn-in board (20), are loaded, according to preset sorting criteria, onto trays (30) corresponding to the sorting criteria; and a first buffer tray unit (610) which is installed to allow trays (30) to move to a loading position over the DC test unit (170) and avoidance positions horizontally spaced apart from the loading position such that the devices (10) which were found to be faulty as a result of the DC test by the DC test unit (170) are temporarily loaded on a tray (30). La présente invention concerne un dispositif de tri de dispositifs, et plus particulièrement un appareil de tri de dispositifs permettant le tri automatique de dispositifs, tels que des puces semi-conductrices, en fonction d'un critère de tri. L'invention concerne un appareil de tri de dispositif comprenant : une unité de chargement (100) sur laquelle un plateau (30) sur lequel sont chargés des dispositifs (10) à inspecter doit être chargé ; une unité de test CC (170) qui reçoit les dispositifs (10) à inspecter à partir de l'unité de chargement (100), pour effectuer un test CC ; une table X-Y (410) pour déplacer, dans les directions X-Y, une carte de vieillissement artificiel (20) sur laquelle les dispositifs (10) à inspecter qui ont été testés et considérés comme étant bons produits par l'unité de test CC (17) sont chargés dans des espaces vides à partir desquels les dispositifs (10) à trier ont été retirés ; une unité de déchargement (300) sur laquelle les dispositifs (10) à trier, qui ont été retirés de la carte de vieillissement artificiel (20), sont chargés, selon des critères de tri prédéfinis, sur des plateaux (30) correspondant aux critères de tri ; et une première unité de plateau tampon (610) qui est installée pour permettre aux plateaux (30) de se déplacer vers une position de chargement sur l'unité de test CC (170) et des positions d'évitement espacées horizontalement de la position de chargement de telle sorte que les dispositifs (10) qui ont été considérés comme étant défectueuses suite à l'essai CC par l'unité de test CC (170) sont temporairement chargés sur un plateau (30). 본 발명은 소자소팅장치에 관한 것으로서, 보다 상세하게는 반도체칩과 같은 소자를 분류기준에 따라서 자동으로 분류하는 소자소팅장치에 관한 것이다. 본 발명은, 검사될 소자(10)들이 적재된 트레이(30)가 로딩되는 로딩부(100)와; 로딩부(100)로부터 검사될 소자(10)들을 전달받아 DC테스트를 수행하는 DC테스트부(170)와; 분류될 소자(10)들이 인출된 빈자리에 DC테스트부(170)에서 양품으로 테스트된 검사될 소자(10)가 적재되는 번인보드(20)를 X-Y방향으로 이동시키는 X-Y테이블(410)과; 번인보드(20)로부터 인출된 분류될 소자(10)가 미리 설정된 분류기준에 따라서 해당 분류기준에 대응되는 트레이(30)에 적재되는 언로딩부(300)와; DC테스트부(170)의 상측의 적재위치 및 적재위치로부터 수평방향으로 이격된 회피위치로 트레이(30)가 이동가능하게 설치되어 트레이(30)에 DC테스트부(170)의 DC테스트 결과 불량으로 검사된 소자(10)들이 임시로 적재되는 제1버퍼트레이부(610)를 포함하는 것을 특징으로 하는 소자소팅장치를 개시한다.