X-RAY BACKSCATTER SYSTEMS AND METHODS FOR PERFORMING IMAGING TOMOSYNTHESIS

• Main Authors: SAMANT, Sanjiv Singh, ROLISON, Lucas M, BACIAK, James Edward
• Format: Patent
• Language: English; French
• Published: 17.10.2019
• Subjects: DETECTING MASSES OR OBJECTS; DIAGNOSIS; GAMMA RAY OR X-RAY MICROSCOPES; GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; HUMAN NECESSITIES; HYGIENE; IDENTIFICATION; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; IRRADIATION DEVICES; MEASUREMENT OF NUCLEAR OR X-RADIATION; MEASURING; MEDICAL OR VETERINARY SCIENCE; NUCLEAR ENGINEERING; NUCLEAR PHYSICS; PHYSICS; SURGERY; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR; TESTING

X-ray backscatter imaging (XBI) methods and systems are provided that enable depth-sensitive information to be obtained from images acquired during a single scan from a single side of an object being imaged. The depth-sensitive information is used in combination with other image information acquired during the scan to produce high-resolution 2-D or 3-D images, where at least one of the dimensions of the 2-D or 3-D image corresponds to depth in the object. L'invention concerne des procédés et des systèmes d'imagerie par rétrodiffusion de rayons X (XBI) qui permettent d'obtenir des informations sensibles à la profondeur à partir d'images acquises pendant un balayage unique à partir d'un seul côté d'un objet imagé. Les informations sensibles à la profondeur sont utilisées en combinaison avec d'autres informations d'image acquises pendant le balayage pour produire des images 2D ou 3D à haute résolution, au moins l'une des dimensions de l'image 2D ou 3D correspondant à la profondeur dans l'objet.