COPPER ALLOY FOR ELECTRONIC/ELECTRIC DEVICE, COPPER ALLOY SHEET/STRIP MATERIAL FOR ELECTRONIC/ELECTRIC DEVICE, COMPONENT FOR ELECTRONIC/ELECTRIC DEVICE, TERMINAL, AND BUSBAR
This copper alloy for electronic/electric devices contains, by mass%, greater than or equal to 0.15% and less than 0.35% of Mg and greater than or equal to 0.0005% and less than 0.01% of P, the remainder consisting of Cu and unavoidable impurities, and satisfies (Mg)+20×(P) < 0.5, wherein, of the...
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03.10.2019
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Abstract | This copper alloy for electronic/electric devices contains, by mass%, greater than or equal to 0.15% and less than 0.35% of Mg and greater than or equal to 0.0005% and less than 0.01% of P, the remainder consisting of Cu and unavoidable impurities, and satisfies (Mg)+20×(P) < 0.5, wherein, of the unavoidable impurities, the H content is less than or equal to 10 mass ppm, the O content is less than or equal to 100 mass ppm, the S content is less than or equal to 50 mass ppm and the C content is less than or equal to 10 mass ppm. The ratio NFJ3 of J3's, ofwhich all three grain boundaries of the grain boundary triple points are a special grain boundary, to all grain boundary triple points, and the ratio NFJ2 of J2's, of which two of the grain boundaries of the grain boundary triple point are special boundaries and one is a random grain boundary, to all grain boundary triple points, satisfy 0.20 < (NFJ2/(1-NFJ3) )0.5 ≤ 0.45.
L'invention concerne un alliage de cuivre pour dispositifs électroniques/électriques qui contient, en % en masse, une quantité supérieure ou égale à 0,15 % et inférieure à 0,35 % de Mg et une quantité supérieure ou égale à 0,0005 % et inférieure à 0,01 % de P, le reste étant constitué de Cu et d'impuretés inévitables, et qui satisfait la relation (Mg)+20×(P) < 0,5, dans lequel, parmi les impuretés inévitables, la teneur en H est inférieure ou égale à 10 ppm en masse, la teneur en O est inférieure ou égale à 100 ppm en masse, la teneur en S est inférieure ou égale à 50 ppm en masse et la teneur en C est inférieure ou égale à 10 ppm en masse. Le rapport NFJ3 des J3, dont les trois joints de grain des points triples de joint de grain constituent toutes un joint de grain spécial, à tous les points triples de joint de grain, et le rapport NFJ2 des J2, dont deux des joints de grain du point triple de joint de grain constituent des joints spéciaux et un constitue un joint de grain aléatoire, à tous les points triples de joint de grain, satisfont à la relation 0,20 < (NFJ2/(1-NFJ3)) 0.5 ≤ 0.45.
この電子・電気機器用銅合金は、質量%で、Mg:0.15%以上0.35%未満、及びP:0.0005%以上0.01%未満を含み、残部がCuおよび不可避的不純物からなり、〔Mg〕+20×〔P〕<0.5を満たし、不可避的不純物のうち、H量が10massppm以下、O量が100massppm以下、S量が50massppm以下、C量が10massppm以下であり、粒界3重点の3つの粒界全てが特殊粒界であるJ3の全粒界3重点に対する割合NFJ3と、粒界3重点の2つの粒界が特殊粒界であり1つがランダム粒界であるJ2の全粒界3重点に対する割合NFJ2が0.20<(NFJ2/(1-NFJ3))0.5≦0.45を満たす。 |
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AbstractList | This copper alloy for electronic/electric devices contains, by mass%, greater than or equal to 0.15% and less than 0.35% of Mg and greater than or equal to 0.0005% and less than 0.01% of P, the remainder consisting of Cu and unavoidable impurities, and satisfies (Mg)+20×(P) < 0.5, wherein, of the unavoidable impurities, the H content is less than or equal to 10 mass ppm, the O content is less than or equal to 100 mass ppm, the S content is less than or equal to 50 mass ppm and the C content is less than or equal to 10 mass ppm. The ratio NFJ3 of J3's, ofwhich all three grain boundaries of the grain boundary triple points are a special grain boundary, to all grain boundary triple points, and the ratio NFJ2 of J2's, of which two of the grain boundaries of the grain boundary triple point are special boundaries and one is a random grain boundary, to all grain boundary triple points, satisfy 0.20 < (NFJ2/(1-NFJ3) )0.5 ≤ 0.45.
L'invention concerne un alliage de cuivre pour dispositifs électroniques/électriques qui contient, en % en masse, une quantité supérieure ou égale à 0,15 % et inférieure à 0,35 % de Mg et une quantité supérieure ou égale à 0,0005 % et inférieure à 0,01 % de P, le reste étant constitué de Cu et d'impuretés inévitables, et qui satisfait la relation (Mg)+20×(P) < 0,5, dans lequel, parmi les impuretés inévitables, la teneur en H est inférieure ou égale à 10 ppm en masse, la teneur en O est inférieure ou égale à 100 ppm en masse, la teneur en S est inférieure ou égale à 50 ppm en masse et la teneur en C est inférieure ou égale à 10 ppm en masse. Le rapport NFJ3 des J3, dont les trois joints de grain des points triples de joint de grain constituent toutes un joint de grain spécial, à tous les points triples de joint de grain, et le rapport NFJ2 des J2, dont deux des joints de grain du point triple de joint de grain constituent des joints spéciaux et un constitue un joint de grain aléatoire, à tous les points triples de joint de grain, satisfont à la relation 0,20 < (NFJ2/(1-NFJ3)) 0.5 ≤ 0.45.
この電子・電気機器用銅合金は、質量%で、Mg:0.15%以上0.35%未満、及びP:0.0005%以上0.01%未満を含み、残部がCuおよび不可避的不純物からなり、〔Mg〕+20×〔P〕<0.5を満たし、不可避的不純物のうち、H量が10massppm以下、O量が100massppm以下、S量が50massppm以下、C量が10massppm以下であり、粒界3重点の3つの粒界全てが特殊粒界であるJ3の全粒界3重点に対する割合NFJ3と、粒界3重点の2つの粒界が特殊粒界であり1つがランダム粒界であるJ2の全粒界3重点に対する割合NFJ2が0.20<(NFJ2/(1-NFJ3))0.5≦0.45を満たす。 |
Author | MAKI Kazunari AKISAKA Yoshiteru MORI Hiroyuki MATSUNAGA Hirotaka KAWASAKI Kenichiro |
Author_xml | – fullname: MORI Hiroyuki – fullname: KAWASAKI Kenichiro – fullname: MAKI Kazunari – fullname: AKISAKA Yoshiteru – fullname: MATSUNAGA Hirotaka |
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DocumentTitleAlternate | ALLIAGE DE CUIVRE POUR DISPOSITIF ÉLECTRONIQUE/ÉLECTRIQUE, MATÉRIAU EN FEUILLE/BANDE EN STRIP ALLIAGE DE CUIVRE POUR DISPOSITIF ÉLECTRONIQUE/ÉLECTRIQUE, COMPOSANT POUR DISPOSITIF ÉLECTRONIQUE/ÉLECTRIQUE, BORNE ET BARRE OMNIBUS 電子・電気機器用銅合金、電子・電気機器用銅合金板条材、電子・電気機器用部品、端子、及び、バスバー |
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Snippet | This copper alloy for electronic/electric devices contains, by mass%, greater than or equal to 0.15% and less than 0.35% of Mg and greater than or equal to... |
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SubjectTerms | ALLOYS BASIC ELECTRIC ELEMENTS CABLES CHANGING THE PHYSICAL STRUCTURE OF NON-FERROUS METALS ANDNON-FERROUS ALLOYS CHEMISTRY CONDUCTORS ELECTRICITY FERROUS OR NON-FERROUS ALLOYS INSULATORS METALLURGY SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING ORDIELECTRIC PROPERTIES TREATMENT OF ALLOYS OR NON-FERROUS METALS |
Title | COPPER ALLOY FOR ELECTRONIC/ELECTRIC DEVICE, COPPER ALLOY SHEET/STRIP MATERIAL FOR ELECTRONIC/ELECTRIC DEVICE, COMPONENT FOR ELECTRONIC/ELECTRIC DEVICE, TERMINAL, AND BUSBAR |
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