EMISSIVITY TESTING METHOD BASED ON INFRARED THERMAL IMAGER

An emissivity testing method based on an infrared thermal imager, comprising: measuring physical parameters of an environment (S101); setting built-in parameters of an infrared thermal imager according to the physical parameters of the environment, and setting an infrared measurement distance (S102)...

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Bibliographic Details
Main Authors HU, Jian Jing, LIU, Ruo Peng, LIU, Kai, ZHANG, Yun Xiang, YANG, Yu, ZHAO, Zhi Ya
Format Patent
LanguageChinese
English
French
Published 03.01.2019
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Summary:An emissivity testing method based on an infrared thermal imager, comprising: measuring physical parameters of an environment (S101); setting built-in parameters of an infrared thermal imager according to the physical parameters of the environment, and setting an infrared measurement distance (S102); measuring the temperature of an object surface (S103); and irradiating the object surface using the infrared thermal imager, and adjusting radiance parameters of the infrared thermal imager until the display temperature is identical to the temperature of the object surface, the radiance of the infrared thermal imager being the emissivity of the object surface (S104). In the method, according to the operating principle of an infrared thermal imager, and depending on the precision of the infrared thermal imager, the temperature of an object surface is accurately measured by means of the temperature measurement accuracy of a thermocouple and a thermistor, or the stability of the thermal conductivity and emissivity o
Bibliography:Application Number: WO2018CN83683