ACCURACY MANAGEMENT METHOD, ACCURACY MANAGEMENT SYSTEM, MANAGEMENT DEVICE, ANALYSIS DEVICE, AND METHOD FOR DETERMINING ABNORMALITY IN ACCURACY MANAGEMENT

• Main Authors: FUJIMOTO Keiji, HASUI Yasushi, MATSUOKA Kazuhiko
• Format: Patent
• Language: English; French; Japanese
• Published: 09.08.2018
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

Provided are an accuracy management method, an accuracy management system, a management device, an analysis device, and a method for determining an abnormality in accuracy management, whereby the quality of accuracy management can be increased by adequately utilizing measurement results for both an...