AUTOMATIC OPTICAL INSPECTION DEVICE AND METHOD

• Main Authors: WANG, Fan, LU, Hailiang, XU, Wen, ZHANG, Pengli, JIA, Junwei, ZHOU, Hongji
• Format: Patent
• Language: Chinese; English; French
• Published: 07.12.2017
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

A device and a method for automatic optical inspection (AOI), the device being used for inspecting items (102) to be inspected on a work table (101), and comprising: a plurality of probes (111, 112) used for capturing images of items to be inspected (102); a plurality of light sources (121, 122), used for illuminating the items to be inspected (102) in different illumination modes; and, a synchronizing controller (140) connected by signaling means to said probes (111, 112) and to said multiple light sources (121, 122), the synchronizing controller (140) being used for directly or indirectly controlling the switching on and off of each of said probes (111, 112) and said multiple light sources (121, 122) according to a certain time sequence and on the basis of the positions of items to be inspected (102), allowing each probe (111, 112) to capture images of an item to be inspected (102) under the illumination mode of a corresponding light source (121, 122), and allowing a light source (121, 122) to illuminate th