METHOD FOR PRODUCING SILICON TARGET STRUCTURE AND SILICON TARGET STRUCTURE
In this method for producing a silicon target structure, an Ag film is formed at the join surface of a silicon target, the silicon target is integrated with a copper backing plate by interposing indium solder between the Ag film and the copper backing plate, and the indium solder is heated/melted to...
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Format | Patent |
Language | English French Japanese |
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22.01.2015
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Abstract | In this method for producing a silicon target structure, an Ag film is formed at the join surface of a silicon target, the silicon target is integrated with a copper backing plate by interposing indium solder between the Ag film and the copper backing plate, and the indium solder is heated/melted to join the silicon target to the copper backing plate, thus integrally joining the silicon target to the copper backing plate.
L'invention concerne un procédé de fabrication d'une structure de cible de silicium, selon lequel un film d'argent est formé au niveau de la surface de liaison d'une cible de silicium, la cible de silicium est intégrée à une plaque support en cuivre par interposition d'une brasure à l'indium entre le film d'argent et la plaque support en cuivre, et la brasure à l'indium est chauffée/fondue pour assembler la cible de silicium à la plaque support en cuivre, de sorte que la cible de silicium et la plaque support en cuivre s'assemblent en ne formant qu'une seule pièce. |
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AbstractList | In this method for producing a silicon target structure, an Ag film is formed at the join surface of a silicon target, the silicon target is integrated with a copper backing plate by interposing indium solder between the Ag film and the copper backing plate, and the indium solder is heated/melted to join the silicon target to the copper backing plate, thus integrally joining the silicon target to the copper backing plate.
L'invention concerne un procédé de fabrication d'une structure de cible de silicium, selon lequel un film d'argent est formé au niveau de la surface de liaison d'une cible de silicium, la cible de silicium est intégrée à une plaque support en cuivre par interposition d'une brasure à l'indium entre le film d'argent et la plaque support en cuivre, et la brasure à l'indium est chauffée/fondue pour assembler la cible de silicium à la plaque support en cuivre, de sorte que la cible de silicium et la plaque support en cuivre s'assemblent en ne formant qu'une seule pièce. |
Author | TSUZUKIHASHI KOJI KANAI MASAHIRO IKEDA HIROSHI YASUKAWA TAKAMASA |
Author_xml | – fullname: YASUKAWA TAKAMASA – fullname: TSUZUKIHASHI KOJI – fullname: IKEDA HIROSHI – fullname: KANAI MASAHIRO |
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DocumentTitleAlternate | PROCÉDÉ DE FABRICATION D'UNE STRUCTURE DE CIBLE DE SILICIUM ET STRUCTURE DE CIBLE DE SILICIUM |
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RelatedCompanies | MITSUBISHI MATERIALS CORPORATION MITSUBISHI MATERIALS ELECTRONIC CHEMICALS CO., LTD |
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Snippet | In this method for producing a silicon target structure, an Ag film is formed at the join surface of a silicon target, the silicon target is integrated with a... |
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SubjectTerms | BASIC ELECTRIC ELEMENTS CHEMICAL SURFACE TREATMENT CHEMISTRY COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL COATING MATERIAL WITH METALLIC MATERIAL COATING METALLIC MATERIAL DIFFUSION TREATMENT OF METALLIC MATERIAL ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL METALLURGY SEMICONDUCTOR DEVICES SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION |
Title | METHOD FOR PRODUCING SILICON TARGET STRUCTURE AND SILICON TARGET STRUCTURE |
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