LIQUID COMPOSITION FOR CLEANING, METHOD FOR CLEANING SEMICONDUCTOR ELEMENT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT
[Problem] The purpose of the present invention is to provide: a liquid composition for cleaning, which removes an organosiloxane thin film, a dry etching residue and a photoresist on the surface of an object to be processed in the production procedure of a semiconductor element, while suppressing da...
Saved in:
Main Authors | , , , |
---|---|
Format | Patent |
Language | English French Japanese |
Published |
19.12.2013
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Abstract | [Problem] The purpose of the present invention is to provide: a liquid composition for cleaning, which removes an organosiloxane thin film, a dry etching residue and a photoresist on the surface of an object to be processed in the production procedure of a semiconductor element, while suppressing damage to a low dielectric constant interlayer insulating film, a wiring material such as copper or a copper alloy, a barrier metal and a barrier insulating film; a method for cleaning a semiconductor element, which uses the liquid composition for cleaning; and a method for manufacturing a semiconductor element, which uses the liquid composition for cleaning. [Solution] A liquid composition for cleaning according to the present invention, which is used for the production of a semiconductor element, contains: 0.05-25% by mass of quaternary ammonium hydroxide; 0.001-1.0% by mass of potassium hydroxide; 5-85% by mass of a water-soluble organic solvent; and 0.0005-10% by mass of a pyrazole.
[Problème] L'objet de la présente invention est de produire : une composition liquide permettant de nettoyer, laquelle retire une pellicule mince d'organosiloxane, un résidu de gravure par voie sèche et un enduit photorésistant sur la surface d'un objet à traiter dans la procédure de production d'un élément semi-conducteur, tout en évitant d'endommager une pellicule isolante intercouche à faible constante diélectrique, un matériau de circuit, par exemple du cuivre ou un alliage de cuivre, un métal de barrière et une pellicule isolante de barrière ; un procédé permettant de nettoyer un élément semi-conducteur, lequel utilise la composition liquide permettant de nettoyer ; et un procédé de fabrication d'un élément semi-conducteur, lequel utilise la composition liquide permettant de nettoyer. [Solution] La composition liquide permettant de nettoyer selon la présente invention, laquelle est utilisée pour la production d'un élément semi-conducteur, contient : 0,05 à 25 % en masse d'hydroxyde d'ammonium quaternaire ; 0,001 à 1,0 % en masse d'hydroxyde de potassium ; 5 à 85 % en masse d'un solvant organique soluble dans l'eau ; et 0,0005 à 10 % en masse d'un pyrazole. |
---|---|
AbstractList | [Problem] The purpose of the present invention is to provide: a liquid composition for cleaning, which removes an organosiloxane thin film, a dry etching residue and a photoresist on the surface of an object to be processed in the production procedure of a semiconductor element, while suppressing damage to a low dielectric constant interlayer insulating film, a wiring material such as copper or a copper alloy, a barrier metal and a barrier insulating film; a method for cleaning a semiconductor element, which uses the liquid composition for cleaning; and a method for manufacturing a semiconductor element, which uses the liquid composition for cleaning. [Solution] A liquid composition for cleaning according to the present invention, which is used for the production of a semiconductor element, contains: 0.05-25% by mass of quaternary ammonium hydroxide; 0.001-1.0% by mass of potassium hydroxide; 5-85% by mass of a water-soluble organic solvent; and 0.0005-10% by mass of a pyrazole.
[Problème] L'objet de la présente invention est de produire : une composition liquide permettant de nettoyer, laquelle retire une pellicule mince d'organosiloxane, un résidu de gravure par voie sèche et un enduit photorésistant sur la surface d'un objet à traiter dans la procédure de production d'un élément semi-conducteur, tout en évitant d'endommager une pellicule isolante intercouche à faible constante diélectrique, un matériau de circuit, par exemple du cuivre ou un alliage de cuivre, un métal de barrière et une pellicule isolante de barrière ; un procédé permettant de nettoyer un élément semi-conducteur, lequel utilise la composition liquide permettant de nettoyer ; et un procédé de fabrication d'un élément semi-conducteur, lequel utilise la composition liquide permettant de nettoyer. [Solution] La composition liquide permettant de nettoyer selon la présente invention, laquelle est utilisée pour la production d'un élément semi-conducteur, contient : 0,05 à 25 % en masse d'hydroxyde d'ammonium quaternaire ; 0,001 à 1,0 % en masse d'hydroxyde de potassium ; 5 à 85 % en masse d'un solvant organique soluble dans l'eau ; et 0,0005 à 10 % en masse d'un pyrazole. |
Author | OHTO MASARU YOSHIDA HIROSHI ABE KOJIRO SHIMADA KENJI |
Author_xml | – fullname: SHIMADA KENJI – fullname: YOSHIDA HIROSHI – fullname: OHTO MASARU – fullname: ABE KOJIRO |
BookMark | eNrjYmDJy89L5WSo8_EMDPV0UXD29w3wD_YM8fT3U3DzD1Jw9nF19PP0c9dR8HUN8fB3QRFUCHb19XT293MJdQ4BCrv6uPq6-oXoKDj6uSAr93X0C3VzdA4JDcKph4eBNS0xpziVF0pzMyi7uYY4e-imFuTHpxYXJCan5qWWxIf7GxkYGhtamBsbGjsaGhOnCgB8zT5z |
ContentType | Patent |
DBID | EVB |
DatabaseName | esp@cenet |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: EVB name: esp@cenet url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP sourceTypes: Open Access Repository |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Medicine Chemistry Sciences Physics |
DocumentTitleAlternate | COMPOSITION LIQUIDE PERMETTANT DE NETTOYER, PROCÉDÉ PERMETTANT DE NETTOYER UN ÉLÉMENT SEMI-CONDUCTEUR, ET PROCÉDÉ DE FABRICATION D'UN ÉLÉMENT SEMI-CONDUCTEUR |
ExternalDocumentID | WO2013187313A1 |
GroupedDBID | EVB |
ID | FETCH-epo_espacenet_WO2013187313A13 |
IEDL.DBID | EVB |
IngestDate | Fri Jul 19 13:08:21 EDT 2024 |
IsOpenAccess | true |
IsPeerReviewed | false |
IsScholarly | false |
Language | English French Japanese |
LinkModel | DirectLink |
MergedId | FETCHMERGED-epo_espacenet_WO2013187313A13 |
Notes | Application Number: WO2013JP65738 |
OpenAccessLink | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131219&DB=EPODOC&CC=WO&NR=2013187313A1 |
ParticipantIDs | epo_espacenet_WO2013187313A1 |
PublicationCentury | 2000 |
PublicationDate | 20131219 |
PublicationDateYYYYMMDD | 2013-12-19 |
PublicationDate_xml | – month: 12 year: 2013 text: 20131219 day: 19 |
PublicationDecade | 2010 |
PublicationYear | 2013 |
RelatedCompanies | MITSUBISHI GAS CHEMICAL COMPANY, INC |
RelatedCompanies_xml | – name: MITSUBISHI GAS CHEMICAL COMPANY, INC |
Score | 3.02929 |
Snippet | [Problem] The purpose of the present invention is to provide: a liquid composition for cleaning, which removes an organosiloxane thin film, a dry etching... |
SourceID | epo |
SourceType | Open Access Repository |
SubjectTerms | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
Title | LIQUID COMPOSITION FOR CLEANING, METHOD FOR CLEANING SEMICONDUCTOR ELEMENT, AND METHOD FOR MANUFACTURING SEMICONDUCTOR ELEMENT |
URI | https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20131219&DB=EPODOC&locale=&CC=WO&NR=2013187313A1 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfR1dT8JArCH4-aao8QPNJRqeWGRfbHsgZtxtMsM2hE15I7tjJBoDRGZ887d7d4Ligz5ee9ekTdpee20P4MrJTdOmNFcaWWYqRmZTxXGordisqeV0wqyxnFMQRs1OatwNzWEJXla9MHJO6Lscjsg1inF9L6S9nv8ksYisrVxc0ycOmt34SYvUltGxqqtCA0m75fViEuMaxjxuq0X9L5xt6aru8lhpg1-kLVEA5j20RV_KfN2p-Huw2eP0psU-lJ6zCuzg1d9rFdgOl0_eFdiSNZpswYFLPVwcwEc3uE8DgnAc9uJBINJMiIdzCHc9Nwqi2zoKvaQTk19ANBAyjyOS4oSDva4c5F9HbkTWt4dulPouTtL-n2cO4dL3EtxROEujbwmOHuN1_vUjKE9n0_wYUINqGaPcIOoZM5rMtK3cMZyx1pholkbHkxOo_kfp9H_0GeyKpaj-UJ0qlIvXt_yc-_CCXkjRfwIQFZYq |
link.rule.ids | 230,309,783,888,25578,76884 |
linkProvider | European Patent Office |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8Q_MA3RY0fqEs0PLHIvtj2QMxoNzfdOoRNeSPrGInGAJEZ3_zb7SooPsjr79pLrs21vfbuV4ArM9M0g9JMbCaJJqqJQUXTpIZopC05o-NUH3GegoC03Fi9G2iDErwua2E4T-gHJ0dkHpUyf8_5ej37vcTCPLdyfk2fGTS9caI2ri-iY0mRCg_EnbbdDXGI6gixuK1Oet8yQ1ckxWKx0gY7ZBsF07792CnqUmarm4qzC5tdpm-S70HpJalCBS3_XqvCdrB48q7CFs_RTOcMXPjhfB8-fe8h9rCAwqAb9r3imklg4ZyAfNsiHrltCIEduSH-Awr9YsxDgmMUMdj2OZF_Q7AIXm0eWCR2LBTFvX_7HMClY0fIFZlJw58RHD6Fq_Yrh1CeTCfZEQhNKicpZQuikqRqK9UMPTNVcyQ3x7Iu09H4GGrrNJ2sF19AxY0Cf-h75P4UdgpRkQkimTUo52_v2Rnbz3N6zqfhC0SKmRo |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=LIQUID+COMPOSITION+FOR+CLEANING%2C+METHOD+FOR+CLEANING+SEMICONDUCTOR+ELEMENT%2C+AND+METHOD+FOR+MANUFACTURING+SEMICONDUCTOR+ELEMENT&rft.inventor=SHIMADA+KENJI&rft.inventor=YOSHIDA+HIROSHI&rft.inventor=OHTO+MASARU&rft.inventor=ABE+KOJIRO&rft.date=2013-12-19&rft.externalDBID=A1&rft.externalDocID=WO2013187313A1 |