COMPOSITE MICROSCOPE COMBINING SCANNING PROBE MICROSCOPE AND OPTICAL MICROSCOPE; CONTROL DEVICE, CONTROL METHOD, AND CONTROL PROGRAM THEREFOR; AND RECORDING MEDIUM

This composite microscope (10) is provided with: an optical microscope (11) for acquiring dynamic light microscopy data about a sample (S); a scanning probe microscope (12) for acquiring dynamic SPM observation data about the sample (S); and a control device (13) for simultaneously issuing a shared...

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Bibliographic Details
Main Authors SAKAI, NOBUAKI, ITO, SHUICHI, YAGI, AKIRA, UEKUSA, YOSHITSUGU
Format Patent
LanguageEnglish
French
Japanese
Published 31.10.2013
Subjects
APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
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Summary:This composite microscope (10) is provided with: an optical microscope (11) for acquiring dynamic light microscopy data about a sample (S); a scanning probe microscope (12) for acquiring dynamic SPM observation data about the sample (S); and a control device (13) for simultaneously issuing a shared control command to the optical microscope (11) and the scanning probe microscope (12). La présente invention concerne un microscope composite (10) qui est équipé : d'un microscope optique (11) permettant d'acquérir des données microscopiques de lumière dynamique à propos d'un échantillon (S) ; d'un microscope à sonde à balayage (12) permettant d'obtenir des données d'observation dynamiques SPM à propos de l'échantillon (S) ; et d'un dispositif de commande (13) permettant d'émettre simultanément une instruction de commande partagée vers le microscope optique (11) et le microscope à sonde à balayage (12).
Bibliography:Application Number: WO2013JP60518