METHODS, COMPOSITIONS AND SYSTEMS FOR SAMPLE DEPOSITION

Methods, compositions, systems, apparatus, and kits are provided for depositing samples onto surfaces. The samples can include one or more particles, and the surface can include one or more reaction chambers. In some embodiments, the depositing can include the use of companion particles in combinati...

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Bibliographic Details
Main Authors REED, JESSICA, REARICK, TODD, GIOIA, JASON, HAPSHE, NICHOLAS, REED, BRIAN, DRESSMAN, DEVIN
Format Patent
LanguageEnglish
French
Published 26.10.2012
Subjects
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Summary:Methods, compositions, systems, apparatus, and kits are provided for depositing samples onto surfaces. The samples can include one or more particles, and the surface can include one or more reaction chambers. In some embodiments, the depositing can include the use of companion particles in combination with sample particles. L'invention concerne des méthodes, compositions, systèmes, appareils et kits de dépôt d'échantillon sur des surfaces. Les échantillons peuvent comprendre une ou plusieurs particules et la surface peut comprendre une ou plusieurs chambres de réaction. Dans certains modes de réalisation, le dépôt peut consister à utiliser des particules compagnes combinées avec les particules d'échantillon.
Bibliography:Application Number: WO2012US34358