METHODS FOR ASSESSING A TEMPERATURE IN A SUBSURFACE FORMATION

Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated...

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Bibliographic Details
Main Authors THOMPSON, STEPHEN TAYLOR, NGUYEN, SCOTT VINH, GESUALDI, ERIC ABREU, DE ST. REMEY, EDWARD EVERETT, ARORA, DHRUV, BURNS, DAVID BOOTH, BASS, RONALD MARSHALL
Format Patent
LanguageEnglish
French
Published 14.04.2011
Subjects
MEASURING
MEASURING QUANTITY OF HEAT
MEASURING TEMPERATURE
PHYSICS
TESTING
THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
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Summary:Methods for assessing a temperature in an opening in a subsurface formation are described herein. A method may include assessing one or more dielectric properties along a length of an insulated conductor located in the opening and assessing one or more temperatures along the length of the insulated conductor based on the one or more assessed dielectric properties. L'invention concerne des procédés permettant d'évaluer une température dans une ouverture d'une formation souterraine. Un procédé peut consister notamment à évaluer une ou plusieurs propriétés diélectriques sur une longueur d'un conducteur isolé situé dans l'ouverture et à évaluer une ou plusieurs températures sur la longueur du conducteur isolé en fonction desdites propriétés diélectriques.
Bibliography:Application Number: WO2010US52027