ULTRA WIDE ANGLE MEMS SCANNER ARCHITECTURE

An optical microscanner achieves wide rotation angles utilizing a curved reflector. The optical microscanner includes a moveable mirror for receiving an incident beam and reflecting the incident beam to produce a reflected beam and a Micro Electro-Mechanical System (MEMS) actuator that causes a line...

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Bibliographic Details
Main Authors HADDARA, HISHAM, KHALIL, DIAA, A., M
Format Patent
LanguageEnglish
French
Published 21.10.2010
Subjects
COLORIMETRY
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
RADIATION PYROMETRY
TESTING
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Summary:An optical microscanner achieves wide rotation angles utilizing a curved reflector. The optical microscanner includes a moveable mirror for receiving an incident beam and reflecting the incident beam to produce a reflected beam and a Micro Electro-Mechanical System (MEMS) actuator that causes a linear displacement of the moveable mirror. The curved reflector produces an angular rotation of the reflected beam based on the linear displacement of the moveable mirror. L'invention concerne un microscanner optique pui permet d'obtenir de grands angles de rotation au moyen d'un réflecteur incurvé. Le microscanner optique comprend un miroir mobile destiné à recevoir un faisceau incident et à réfléchir le faisceau incident afin de produire un faisceau réfléchi, et un actionneur à Système Micro-ÉlectroMécanique (MEMS) qui provoque un déplacement linéaire du miroir mobile. Le réflecteur incurvé produit une rotation angulaire du faisceau réfléchi sur la base du déplacement linéaire du miroir mobile.
Bibliography:Application Number: WO2010US31416