SUPPORT FOR A SEMICONDUCTOR WAFER IN A HIGH TEMPERATURE ENVIRONMENT
A wafer support for supporting a semiconductor wafer during a process including varied temperature. The wafer support includes a body having a top surface adapted to receive the semiconductor wafer so a portion of the top surface supports the wafer. The top surface has a recessed area including an i...
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Main Authors | , , |
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Format | Patent |
Language | English French |
Published |
22.04.2010
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Subjects | |
Online Access | Get full text |
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Summary: | A wafer support for supporting a semiconductor wafer during a process including varied temperature. The wafer support includes a body having a top surface adapted to receive the semiconductor wafer so a portion of the top surface supports the wafer. The top surface has a recessed area including an inclined surface rising from a bottom of the recessed area. The inclined surface has an incline angle that is no more than about ten degrees.
L'invention concerne un support pour plaquette destiné à supporter une plaquette à semi-conducteur pendant un processus comportant une température modifiée. Le support de plaquette comporte un corps ayant une surface supérieure destinée à recevoir la plaquette à semi-conducteur, de façon qu'une partie de la surface supérieure supporte la plaquette. La surface supérieure présente une zone évidée comportant une surface inclinée s'élevant à partir d'un fond de la zone évidée. La surface inclinée présente un angle d'inclinaison qui n'excède pas environ dix degrés. |
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Bibliography: | Application Number: WO2009US60512 |