SYSTEMS AND METHODS FOR MEASURING SAMPLE SURFACE FLATNESS OF CONTINUOUSLY MOVING SAMPLES

• Main Authors: ZWEMER, DIRK, ADRIAN, PAN, JIAHUI, MCCARRON, SEAN, PATRICK, PETRICCIONE, GREGORY, JAMES
• Format: Patent
• Language: English; French
• Published: 27.04.2006
• Subjects: CALCULATING; COMPUTING; COUNTING; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

Measurement of sample surface flatness of a continuously moving sample. A conveyor continuously conveys a sample beneath a grating disposed at a non zero angle with respect to the plane of conveyance. The relative distance between the sample and the angled grating changes with the horizontal transla...